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Measurement Systems and Process Improvement (MSPI) 2010
19 - 20 April 2010
ENBIS - IMEKO TC21 Workshop
MSPI shortened programme
Due to problems problems with air travel, the MSPI workshop has
been shortened to 1 day: Monday 19 April.
No sessions will be held on Tuesday 20 April.
We thank registrants for their efforts to attend, but realise that
it has become impossible for many to do so. All workshop documentation,
CDs etc., will be sent to registrants, and we anticipate being able to offer
some partial refund of registration fees.
It is possible that a further MSPI session will be organised,
possibly at the ENBIS 2010 annual conference on 12 - 16 September
2010 in Antwerp. |
Workshop themes
This Measurement Systems and Process Improvement (MSPI) workshop brings
together measurement scientists, manufacturing engineers, quality professionals
and statisticians to examine the role of measurement systems in statistical
process control, product conformance assessment, and quality improvement.
The workshop will cover topics such as:
- Measurement systems analysis
- Conformance assessment
- Standards for measurement uncertainty evaluation
- Coordination of measuring systems and process control
- Measurement assisted assembly
Workshop format
The workshop will consist of:
- 30-minute invited sessions
- 20-minute contributed sessions
- Poster sessions
Call for Papers
You are invited to submit an abstract for the workshop.
Abstract submission deadline: 10 December 2009
To contribute a paper, please click
here
Download workshop flyer
here  (2.34 MB) and agenda here
(36 KB)
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